Investigation of surface scaling, optical and microwave dielectric studies of Bi0.5Na0.5TiO3 thin films

Herein, we have investigated the optical and microwave dielectric properties of Bi0.5Na0.5TiO3 (BNT) thin films grown under different oxygen pressure (PO2) using pulsed laser deposition technique. The X-ray diffraction measurements confirm single phase BNT secondary a further reduction in increase with PO2, which signifies close relationship between crystal structure content. shift Raman-active TO1, TO2, TO3 modes towards higher wavelengths mode intensity PO2 indicating degree film crystallinity. local roughness (αloc) all obtained as ∼ 0.85 interface width (ω) lateral correlation length (ξ) vary PO2. Also, exhibit an refractive index bandgap due to improvement crystallinity vacancies. show that strong depends on constant (εr = 336) lower loss (tanδ 0.0093) at 5 GHz, shows potential applications high-frequency devices.